ACD/UV-IR Processor
MM Spectra™ Integration
There are many situations that can benefit from the synergistic interaction of Measurement Microsystems' MM Spectra and ACD/UV-IR Manager software. The ability to calibrate and enhance the resolution of your bench top and field instruments on the fly with MM Spectra, along with the ability to process, visualize, store, retrieve, and report the resulting spectral information in ACD/UV-IR Manager accelerates the transformation of analytical data to knowledge.
Quality and speed only form good partnerships in the laboratory if they are linked by either skills or well-designed tools that employ a fundamental understanding of the tasks at hand. The following suggests a few ways in which MM Spectra software can supplement the features of our UV-IR Manager software to quickly deliver quality results.
- Would it be useful if your spectroscopists could apply an algorithm to improve the spectrum resolution for any conventional spectrometer by a factor of ten, allowing them to deliver results to your customers that are almost as good as those taken with instruments that possess expensive high-quality optics?
- Would it save time if your spectroscopists could promptly calibrate any spectrometer in your lab by software without frequent manufacturer's assistance, so that you could ensure the instruments meet the ISO 9000 quality standard without the need for lengthy and costly manual adjustments?
- Would it be valuable if your scientists could reconstruct spectra from different instruments, in order to provide comparable instrument responses for all spectrometers involved, which promise the customer more repeatable results?
- Would it be beneficial if your department could minimize operator interpretation biases by using an algorithm to estimate the magnitude and position of peaks, so that your customer can be assured of the greatest possible consistency between different analyses?
- Would it be helpful if your technicians could run high-resolution instruments at a fast-scan speed and still obtain results consistent with a slow high-quality scan, enabling you to offer your customers quality results within short turnaround times?
All of the above represent real capabilities offered by the software. While this almost sounds too good to be true, it is based upon a solid understanding of optics and years of research by leaders in the field such as Roman Z. Morauski, Ph.D. and colleagues at Measurement Microsystems.
By analogy, the blurriness of letters on an eye chart results from imperfections in your eyes, not in the chart. These imperfections can be characterized and corrected by the optometrist with eyeglasses. Likewise, different types of imperfections in a spectrometer yield spectral blurriness that can be characterized and corrected by MM Spectra algorithms.
To detect the imperfection characteristics of a spectrometer, MM Spectra compares the spectrum for a standard sample against a high-resolution spectrum of this same standard. This allows it to produce a response map of what the imperfections of the instrument are with respect to the high resolution standard. The response can then be used to reconstruct a high quality spectrum from the output of the lower-quality instrument.
- Buy or use a standard bench top instrument to produce high-resolution spectra rather than spending four times the amount or more for spectrometers with high-quality optics.
- Save 30 minutes to several hours of high-resolution scan times with minimal loss of accuracy by running a fast scan and applying MM Spectra.
- Reduce the frequency and cost of manufacturer instrument calibrations without sacrificing accuracy through rapid software calibrations.
- Improve the resolution of field instruments to allow better comparison with bench top quality references.
For more technical details, please visit the MM Spectra web site at www.mm.ca or www.mmspectra.com.
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